Publications

Journal article, Infrared Physics & Technology

Thermal cameras operating in the long-wave infrared (LWIR) spectral range 8–15 μm/1250–667 cm⁻¹ are widely used for temperature inspection in fire sciences. This study explores the expansion of thermal imaging by coupling a standard thermal camera with a scanning Fabry-Pérot interferometer to achieve emission-based hyperspectral imaging.

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Journal article, Review of Scientific Instruments

This work presents a hyperspectral imager sensitive to radiation in the 1250–666 cm⁻¹ wavenumber range (wavelengths between 8 and 15 μm). The system combines a low-order scanning Fabry–Pérot interferometer with a thermal camera utilizing a 1024 × 768-pixel uncooled microbolometer detector.

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Journal article, Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy

The long wave infrared regime of the electromagnetic spectrum has been used to identify and classify different types of plastics. This work presents an early-stage version of an industrial hyperspectral camera, which is based on a low-order scanning Fabry-Pérot interferometer and is sensitive to radiation with wavelengths from 8 µm to 15 µm.

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Ph.D. thesis, University of Southern Denmark

This industrial PhD project represents a collaboration between Newtec Engineering A/S and NanoSYD at the University of Southern Denmark, with financial support from the Innovation Fund Denmark. The project focuses on the development and application of a hyperspectral imaging system that combines a microbolometer-based thermal camera and a low-order scanning Fabry-Pérot interferometer (SFPI).

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Journal article, Polymer Testing

Identification of black plastics poses a significant challenge in recycling due to the absorptive nature of carbon black additives. This work introduces a method where hyperspectral imaging in the long-wave infrared regime is used to distinguish between twelve samples of commercially available black plastics encompassing nine distinct polymer types.

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Conference paper, Proc. SPIE, Image Sensing Technologies XI

This work describes a novel hyperspectral imaging system for the long-wave infrared domain. Being a spectral scanner, it is more versatile compared to single-point and push-broom techniques, which require relative movement between instrument and sample to acquire an image. The imager is equipped with a 1024×768-pixel uncooled microbolometer sensor, which is sensitive to wavelengths in the range from 8 to 14 µm.

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Journal article, Optics Express

Determination of the surface temperature of different materials based on thermographic imaging is a difficult task as the thermal emission spectrum is both temperature and emissivity dependent. Without prior knowledge of the emissivity of the object under investigation, it makes up a temperature-emissivity underdetermined system. This work demonstrates the possibility of recognizing specific materials from hyperspectral thermal images (HSTI) in the wavelength range from 8–14 µm. The hyperspectral images were acquired using a microbolometer sensor array in combination with a scanning 1st order Fabry-Pérot interferometer acting as a bandpass filter.

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Journal article, Organic Electronics

The performance of organic semiconductor devices is strongly affected by the interface energetics at the junctions between the constituent materials. A large group of organic semiconductors consists of rodlike small molecules that crystallize upon deposition with a molecular orientation dependent on the specifics of the molecule–molecule and molecule–substrate interactions. By means of Kelvin probe force microscopy (KPFM), this work studies naphthyl end-capped oligothiophene, 5,50-bis(naphth-2-yl)-2,20-bithiophene (NaT2), deposited on samples of pristine SiO₂ and samples of graphene-covered SiO₂.

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